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Global and Local Contrastive Learning for Classification and Segmentation of Mixed-type Wafer Bin Map Defect Patterns

Year: 2024

Type: conference-paper

DOI: 10.1109/ieem62345.2024.10857047

Authors: Shantong Yin, Rui Wang, Peng Li

Institution: Harbin Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4407129513

FWCI:

Cites: 9

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Related to: 10