Work

Product photography as a tool supporting Attribute Agreement Analysis

Year: 2024

Type: conference-paper

DOI: 10.1109/ieem62345.2024.10857240

Authors: M. Hryb, W. Rudzki

Institution: Poznań University of Technology

Language: English

Topic: Reliability and Agreement in Measurement

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W4407130327

FWCI:

Cites: 19

Cited by:

Related to: 10