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Study on the Cu Microstructure and Sn Supply Affecting the Interfacial Reaction of Cu/Sn Nanowires for Advanced Electronic Packaging

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Year: 2025
Type: article
Source: ACS Applied Electronic Materials
DOI: 10.1021/acsaelm.4c01981
Authors: Ke-Xin Chen, Rui-Chong Li, Li-Yin Gao, Zhi-Chao Meng, Chang Liu, Zhi-Quan Liu
Institutions: University of Science and Technology of China, Chinese Academy of Sciences, Institute of Metal Research, Shenzhen Institutes of Advanced Technology, China Electronics Technology Group Corporation
Language: English

Topic: Electronic Packaging and Soldering Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Basic and Applied Basic Research Foundation of Guangdong Province
Awards: G5913755193, G6935520047, G7880178250
OpenAlex ID: W4407153302
FWCI: 1.155
Cites: 51
Cited by: 5
Related to: 10
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