Study on the Cu Microstructure and Sn Supply Affecting the Interfacial Reaction of Cu/Sn Nanowires for Advanced Electronic Packaging
Year: 2025
Type: article
Source: ACS Applied Electronic Materials
Authors: Ke-Xin Chen, Rui-Chong Li, Li-Yin Gao, Zhi-Chao Meng, Chang Liu, Zhi-Quan Liu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G5913755193, G6935520047, G7880178250
OpenAlex ID: W4407153302
