Work

Extended Invariant Risk Minimization for Machine Fault Diagnosis With Label Noise and Data Shift

Year: 2025

Type: article

Source: IEEE Transactions on Neural Networks and Learning Systems

DOI: 10.1109/tnnls.2025.3531214

Authors: Zhenling Mo, Zijun Zhang, Qiang Miao, Kwok-Leung Tsui

Institutions: City University of Hong Kong, Sichuan University, Virginia Tech

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Henan Provincial Science and Technology Research Project

Award: G3217215641

OpenAlex ID: W4407168494

FWCI: 5.322

Cites: 60

Cited by: 14

Related to: 10