Work

Transfer Learning for Efficient and Accurate Image Forgery Detection

Year: 2024

Type: conference-paper

Source: International Conference on Integrated Intelligence and Communication Systems (ICIICS)

DOI: 10.1109/iciics63763.2024.10859941

Authors: S.N. Tirumala Rao, Ponnam Venkata Sai Teja, Kudari Abhiram, Shaik Sharukh, Meduri Mounika Naga Bhavani, Dodda Venkatreddy

Institution: Narasaraopeta Engineering College

Language: English

Topic: Digital Media Forensic Detection

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407169813

FWCI:

Cites: 4

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Related to: 10