Work

Charge collection properties of a CMOS sensor produced in a 55 nm process

Year: 2025

Type: article

Source: Journal of Instrumentation

DOI: 10.1088/1748-0221/20/02/c02008

Authors: Zijie Zhou, Le Xiao, Kai Chen, Yunpeng Lu, Yang Zhou, Xiangming Sun, Guangming Huang, Chaosong Gao, Lirong Xie, Wenjie Dai, Guoxiang Zhang, Ying Zhang

Institutions: Central China Normal University, Institute of High Energy Physics, Guangxi University

Language: English

Topic: Particle Detector Development and Performance

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407174202

FWCI: 0.473

Cites: 12

Cited by: 1

Related to: 10