Work

Device Characteristic-Aware Quantization for eFlash-Based In-Memory Computing SoC

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)

DOI: 10.1109/icta64028.2024.10860710

Authors: Yizhe Chen, Guangyao Wang, Hanjie Liu, Yuexi Lv, Yuannuo Feng, Minghua Tang, Yong Pei, Wang Kang

Institutions: Beihang University, Xiangtan University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407214251

FWCI: 1.6

Cites: 6

Cited by: 2

Related to: 10