Work

PCB Defect Detection Based on YOLOv5s

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Data Science and Computer Application (ICDSCA)

DOI: 10.1109/icdsca63855.2024.10860133

Author: Yuze Sun

Institution: Shanghai Jiao Tong University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407215154

FWCI: 0.755

Cites: 1

Cited by: 1

Related to: 10