Work

Routability-driven ordered escape routing method based on neural network

Year: 2025

Type: conference-paper

Source: International Workshop on Advanced Imaging Technology (IWAIT)

DOI: 10.1117/12.3057983

Authors: Hung Liang Yeh, Dun Wei Cheng

Institution: National Yunlin University of Science and Technology

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407233337

FWCI:

Cites: 6

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Related to: 10