Work

Best-Fit Techniques to Estimate SBU/MCU Cross Sections From Radiation-Ground Tests in Memories

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3539956

Authors: Francisco J. Franco, Juan C. Fabero, Hortensia Mecha, Mohammadreza Rezaei, Guillaume Hubert, Juan A. Clemente

Institutions: Universidad Complutense de Madrid, Office National d'Études et de Recherches Aérospatiales

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Ministerio de Ciencia e Innovación

Award: G204889000

OpenAlex ID: W4407248223

FWCI: 0.693

Cites: 32

Cited by: 3

Related to: 10