Work

Precision tests of third-generation four-quark operators: one- and two-loop matching

Year: 2025

Type: article

Abstract: A bstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.

Source: Journal of High Energy Physics

DOI: 10.1007/jhep02(2025)038

Authors: Ulrich Haisch, Luc Schnell

Institutions: Max Planck Institute for Physics, Technical University of Munich

Language: English

Topic: Particle physics theoretical and experimental studies

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: diamond

Funders: International Max Planck Research School for Environmental, Cellular and Molecular Microbiology, International Max Planck Research School for Advanced Methods in Process and Systems Engineering

OpenAlex ID: W4407268377