Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. I. System and Implementation Algorithms for Various Product Categories
Year: 2024
Type: article
Source: Russian Microelectronics
Authors: Yu. M. Moskovskaya, D. V. Boychenko
Institution: National Research Nuclear University MEPhI
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407336192