Work

Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results

Year: 2024

Type: article

Source: Russian Microelectronics

DOI: 10.1134/s1063739724700847

Authors: Yu. M. Moskovskaya, D. V. Boychenko

Institution: National Research Nuclear University MEPhI

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407336552

FWCI:

Cites: 8

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Related to: 10