Work

Influence of Manufacturing Defects and Electrical Noise on the Evolution of an Optically Controlled Charge Qubit

Year: 2024

Type: article

Source: Russian Microelectronics

DOI: 10.1134/s1063739724600869

Authors: A. V. Tsukanov, I. Yu. Kateev

Institutions: Russian Academy of Sciences, Institute of Physics and Technology

Language: English

Topic: Semiconductor Quantum Structures and Devices

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407336633

FWCI: 0.318

Cites: 44

Cited by: 2

Related to: 10