Work

ASFE Feature Selection Technique Integrated with SMOTE-ENN for Handling High-Dimensional and Highly Imbalanced Wafer Defect Classification Data

Year: 2024

Type: conference-paper

Source: International Conference on Advanced Computer Theory and Engineering

DOI: 10.1109/icacte62428.2024.10871516

Authors: Yi Wei Tye, Umi Kalsom Yusof, Xin Ying Chew, Samat Tulpar

Institution: Universiti Sains Malaysia

Language: English

Topic: Imbalanced Data Classification Techniques

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407361918

FWCI: 0.589

Cites: 40

Cited by: 2

Related to: 10