Work

Exploring Radiation Effect on GP-SOI MOSFET Performance and Reliability

Year: 2024

Type: conference-paper

DOI: 10.1109/delcon64804.2024.10867100

Authors: Neeshu, Deepanshu, Vandana Kumari, Poonam Kasturi, Manoj Saxena

Institutions: University of Delhi, Deen Dayal Upadhyaya College

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407362611

FWCI:

Cites: 27

Cited by:

Related to: 10