Work

PADRE-Based Analysis to Identify the Effect of Gate Length on Subthreshold Swing and Drain Current of a FinFET Structure

Year: 2024

Type: conference-paper

DOI: 10.1109/delcon64804.2024.10866511

Authors: Annie Maria, K. K. Mishra, Rajnish Sharma

Institution: Chitkara University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407378209

FWCI:

Cites: 23

Cited by:

Related to: 10