Work

Failure analysis of shorting issues in bipolar junction transistors circuit using electron beam induced current technique

Year: 2025

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.35848/1347-4065/adb500

Authors: Paul Jacob, David MacMahon, Santosh Kurinec

Institutions: Rochester Institute of Technology, Micron (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407396371

FWCI:

Cites: 12

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Related to: 10