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Advanced Fault Detection in Industrial Machinery with MFCC-CNN

Year: 2024

Type: conference-paper

Source: International Conference on Artificial Intelligence and Signal Processing (AISP)

DOI: 10.1109/aisp61711.2024.10870634

Authors: Vaisshale Rathinasamy, S Samsthidhaa Sree, D Saranyaraj

Institutions: Amrita Vishwa Vidyapeetham, Vellore Institute of Technology University

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407403161

FWCI: 2.754

Cites: 10

Cited by: 4

Related to: 10