Work

Analysis of static current imbalance of parallel MOSFET affected by thermal resistance

Year: 2024

Type: conference-paper

Source: International Conference on Electrical, Mechanical and Computer Engineering (ICEMCE)

DOI: 10.1109/icemce64157.2024.10861905

Authors: Kun Zhang, Changjiang Wang

Institution: Shandong University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407403407

FWCI:

Cites: 8

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Related to: 10