Work

A Low Complexity Gabor Based CNN Model for Defect Detection in Fabrics

Year: 2024

Type: conference-paper

Source: International Conference on Artificial Intelligence and Signal Processing (AISP)

DOI: 10.1109/aisp61711.2024.10870609

Authors: Gnanaprakash V, Jeen Retna Kumar R, Preethi D, Shoukath Ali K, Saranya N, Joel Devadass Daniel D J

Institutions: Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Bannari Amman Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407404541

FWCI:

Cites: 13

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Related to: 10