Work

Surface Defect Detection Algorithm for PCB Based on Improved YOLOv8

Year: 2024

Type: conference-paper

Source: International Conference on Electrical, Mechanical and Computer Engineering (ICEMCE)

DOI: 10.1109/icemce64157.2024.10862076

Authors: Yan Ai, TingDong Ye

Institution: City University of Macau

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407404903

FWCI: 3.615

Cites: 12

Cited by: 5

Related to: 10