Work

Comparing reflected and emitted radiometric signal levels in short-wave infrared, extended short-wave infrared, mid-wave infrared, and superband (short-wave infrared through mid-wave infrared) optical systems

Year: 2025

Type: article

Source: Optical Engineering

DOI: 10.1117/1.oe.64.2.023102

Authors: Luke D. Somerville, Patrick Leslie, Shane Jordan, C. Kyle Renshaw, Ronald Driggers

Institutions: University of Arizona, University of Central Florida

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407407428

FWCI: 0.693

Cites:

Cited by: 3

Related to: 10