Work

Uncertainty quantification in diffraction gratings: reliability analysis using a reduced basis method

Year: 2025

Type: article

Source: Journal of the Optical Society of America A

DOI: 10.1364/josaa.547823

Authors: Rubén Aylwin, José Pinto, Gerardo Silva-Oelker

Institutions: Adolfo Ibáñez University, Universidad Mayor

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: Agencia Nacional de Investigación y Desarrollo

Awards: COMPUTATIONALLY-EFFICIENT MACHINE LEARNING-BASED HOLISTIC OPTIMIZATION OF THERMOPHOTOVOLTAIC SYSTEMS THROUGH NANO-PHOTONIC ENGINEERING, FAST BOUNDARY INTEGRAL SOLVER FOR SCATTERING PROBLEMS

OpenAlex ID: W4407407485

FWCI:

Cites: 43

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Related to: 10