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Structural Evolution and Cu Diffusion Mechanism in Bi2Se3 Thin Films on YBa2Cu3O7 as a Function of Cracked-Se Processing Time

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Year: 2025
Type: article
Source: Crystal Growth & Design
DOI: 10.1021/acs.cgd.4c01518
Authors: Woo-Jung Lee, Dae-Hyung Cho, Tae-Ha Hwang, Jin Young Maeng, Kwangsik Jeong, So-Young Lim, Rina Kim, Yong-Duck Chung, Jonghyun Song
Institutions: Electronics and Telecommunications Research Institute, Korea University of Science and Technology, Chungnam National University, Yonsei University, Yonsei University Mirae Campus
Language: English

Topic: Topological Materials and Phenomena
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
SDG: Affordable and clean energy

Open Access status: closed

Funders: Electronics and Telecommunications Research Institute, National Research Foundation of Korea
Awards: G1448577599, G1450535516, G1615846799, G1616557015, G248902062
OpenAlex ID: W4407415827
FWCI: 1.156
Cites: 38
Cited by: 3
Related to: 10
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