Fabric Defect Image Generation Based on Improved CycleGAN
Year: 2024
Type: conference-paper
Source: China Automation Congress (CAC)
Authors: Chen Kefeng, Ren Jia, Zou Hongrui
Institution: Zhejiang Sci-Tech University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407456093