Remaining Useful Life Prediction for Hidden Degradation Process with Multiple Source Uncertainty
Year: 2024
Type: conference-paper
Source: China Automation Congress (CAC)
Authors: Xia Wu, Xu Yang, Jian Huang, Jinajina Gao
Institution: University of Science and Technology Beijing
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2411490810, G2600561328, G7933618592
OpenAlex ID: W4407462082
