Work

Node-Loss Detection of Silicon Single Crystal with Dual-Channel Cross-Modality Feature Enhancement

Year: 2024

Type: conference-paper

Source: China Automation Congress (CAC)

DOI: 10.1109/cac63892.2024.10864586

Authors: Tuzhan Liu, Yong Zhang, Junyang Jin, Yaqiong Duan, Maolin Wang, Qianzhi Fang

Institutions: Wuhan University of Science and Technology, Huazhong University of Science and Technology

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407462648

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Cites: 14

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Related to: 10