Work

Study of Electrical Characteristics and Charge Storage Behaviour of Gold Embedded Floating Gate MOS Structure

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870854

Authors: Amrita Banerjee, Gargi Chakraborty, Sunipa Roy

Institutions: Heritage Institute of Technology, Guru Nanak Institute of Technology

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407466251

FWCI:

Cites: 28

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Related to: 10