Work

Performance Analysis of Double-Gate Junctionless Tunnel FET with a Stepped Channel

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870755

Authors: Siva Ramakrishna Gorla, Anil Kumar. Pathakamuri, Kadava R. N. Karthik, Ashok. Tammisetti, Chinna Baji shaik S, Chandan Kumar Pandey, Umakanta Nanda

Institution: VIT-AP University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407466298

FWCI: 0.8

Cites: 19

Cited by: 1

Related to: 10