Work

Enhancing Ultrasonic-Based Distance Measurement Accuracy Through Error Correction Mechanism

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870780

Authors: Abhijit Paul, Arjun Mitra, Prachi Bansal, Mudit Saraff, Bikash Debnath, Jadav Chandra Das

Institutions: Swami Vivekananda University, Amity University, Brainware University, Maulana Abul Kalam Azad University of Technology, West Bengal

Language: English

Topic: Sensor Technology and Measurement Systems

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407466365

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Cites: 12

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Related to: 10