Work

Performance Evaluation of Double Gate Junctionless Accumulation Mode Stacked Gate MOSFET

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870616

Authors: Pradipta Kumar Jena, Srikrishna Bardhan, Sarita Misra, Sudhansu Kumar Pati, Biswajit Baral, Sudhansu Mohan Biswal

Institutions: Odisha University of Technology and Research, Gandhi Institute for Technological Advancement

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407467925

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Cites: 41

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Related to: 10