Work

Analysis of Interface Trap Position Variation in Tunnel FETs

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870770

Authors: Anirudh Koteshwar, Deepjyoti Deb, Shanidul Hoque, Rupam Goswami

Institutions: Vellore Institute of Technology University, Tezpur University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407468655

FWCI: 0.806

Cites: 15

Cited by: 1

Related to: 10