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Enhanced Crop Yield Prediction by Machine Learning Techniques

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870857

Authors: Papiya Das, Abhranil Pal, Rakteem Mullick, Sayak Singha, Subhrapratim Nath

Institution: Meghnad Saha Institute of Technology

Language: English

Topic: Smart Agriculture and AI

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDGs: Zero hunger, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407468656

FWCI: 0.756

Cites: 9

Cited by: 1

Related to: 10