Work

Analog/RF Performance and Reliability Investigation of Nanowire Junctionless MOSFET with Interface Traps

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870625

Authors: Sarita Misra, Kishore Ch Singh, Satish Kumar Das, Sudhansu M Biswal, Kaliprasanna Swain

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407475845

FWCI:

Cites: 47

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Related to: 10