Enhancing Image Segmentation Model in Computing Void Percentage With Mask RCNN
Year: 2025
Type: article
Source: Journal of Electronic Packaging
DOI: 10.1115/1.4067897
Authors: Calvin Ling, Aizat Abas, Chew Cheng Kai, Muhammad Taufik Azahari
Institution: Universiti Sains Malaysia
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407522392