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Silicon Materials Mid-Infrared Direct Spectral Emissivity Measurement at Intermediate Temperatures

Year: 2024

Type: conference-paper

Abstract: International audience

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Akiki, Elissa, Hamaoui, Georges, Hervé, Armande, Marty, Frédéric, Rousseau, Lionel, Bourouina, Tarik, Basset, Philippe, Nefzaoui, E.

Institution: Laboratoire d'électronique, systèmes de communication et microsystèmes

Language: English

Topic: Calibration and Measurement Techniques

Subfield: Aerospace Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4407559103

FWCI:

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