Multimodal Scanning Microwave and Electron Microscopy for nanoscale measurements under vacuum
Year: 2024
Type: conference-paper
Abstract: International audience
Authors: Polovodov, Petr, Lenoir, Clément, Boyaval, Christophe, Haddadi, Kamel, Théron, Didier
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4407562970
