Work

Detection of Neutron Irradiation-Induced Crystal Defects in Silicon with Photoluminescence, Deep Level Transient Spectroscopy and Dark Current Measurements on CMOS Image Sensors

Year: 2024

Type: conference-paper

Abstract: International audience

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Montoya Cardona, Juan Esteban, Joblot, Sylvain, Monflier, Richard, Imbernon, Éric, Antonsanti, Aubin, Le Roch, Alexandre, Marcelot, Olivier, Goiffon, Vincent

Institutions: STMicroelectronics (France), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: Université Catholique de Louvain, Centre National de la Recherche Scientifique

OpenAlex ID: W4407563016

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Related to: 10