Alpha Emission Rate Characterization and Risk Evaluation of Substrate Materials Used in Memory Packages
Year: 2024
Type: conference-paper
Authors: Chen Yu Huang, Chi Yung Chen, Chong Leong Gan, Tracy Tennamt
Institutions: Micron (Taiwan), Micron (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407575046