Work

Chemical Identification of sub 10-µm defects and contamination in packaging

Year: 2024

Type: conference-paper

DOI: 10.1109/iemt61324.2024.10875214

Authors: Michael K. F. Lo, Eoghan P. Dillon, James A. Anderson

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407575097

FWCI:

Cites: 5

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Related to: 10