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Enhancing AOI with AI for Printed Circuit Board Assembly – A Comprehensive Industry Study

Year: 2024

Type: conference-paper

DOI: 10.1109/iemt61324.2024.10875165

Authors: Wayne Zhang, Feng Xue, Romain Roux, Philip Aguilar Reyes, Jorg Richstein, Tatu Qvist, Harri Sievola, Zambri Samsudin, Chwee Liong Tee, Yassin Roslan, Kah Seng Adrian Leong, Daniel Tan, Aersi Aierzhati, Charlie Zhu, Stephan Pimer, Mehdi Hamid, Haley Fu

Institutions: IBM (United States), Jabil (United States), Nokia (Finland), Intel (Malaysia), Nio (China), PDF Solutions (United States)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407575102

FWCI: 0.755

Cites:

Cited by: 1

Related to: 10