Work

Real time inferencing of semiconductor wafer probing process using Machine Learning

Year: 2024

Type: conference-paper

DOI: 10.1109/iemt61324.2024.10875232

Author: Michael Thavarajah

Institution: Intel (Malaysia)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407575402

FWCI: 1.444

Cites: 14

Cited by: 2

Related to: 10