Convolutional Neural Networks based Defect Detection Method for Smart Meter LCD Screen
Year: 2024
Type: conference-paper
Authors: Dengke Zhang, Pu Wei, Xiaolong Li, Jie Yang, Chuanqing Liu
Institution: Nanjing Institute of Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Nanjing Institute of Technology
OpenAlex ID: W4407691310