Storage Reliability Prediction of a MEMS Gyroscope Based on Accelerated Degradation Test
Year: 2024
Type: conference-paper
Authors: Yahui Su, Rui Feng, Yafei Xie, Fengqin Wu, Yimin Wang
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407691780
