A Selective Convolution Kernel Residual Network for Wafer Map Defect Pattern Recognition
Year: 2024
Type: conference-paper
Authors: Yunpeng Xu, Zihao Lei, Shulong Gu, Rui Feng, Yu Su, Guangrui Wen
Institution: Xi'an Jiaotong University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407691854