Degradation Modeling and Remaining Useful Life Assessment Based on the Hougaard Process
Year: 2024
Type: conference-paper
Authors: Hongguang Du, Fan Zhang, Zhenyang Ma
Institution: Civil Aviation University of China
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407691981
