Work

Industrial Defect Image Generation Based on Improved StyleGAN2

Year: 2024

Type: conference-paper

Source: International Forum on Electrical Engineering and Automation (IFEEA)

DOI: 10.1109/ifeea64237.2024.10878721

Authors: Yanqin Wan, Xingxin Li

Institutions: Beijing Jiaotong University, China North Industries Group Corporation (China)

Language: English

Topic: Generative Adversarial Networks and Image Synthesis

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407692145

FWCI:

Cites: 9

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Related to: 10