Work

Wafer map Anomaly Detection Driven by Contrast Learning and Vision Transformer Model

Year: 2024

Type: conference-paper

Source: Global Reliability and Prognostics and Health Management Conference (PHM)

DOI: 10.1109/phm-beijing63284.2024.10874552

Authors: Zhonghao Chang, Kaiyuan Chen, Te Han, Jiajia Xu, Ke Feng, He Li

Institutions: Beijing Institute of Technology, Xi'an Jiaotong University, University of Lisbon, Instituto Superior Técnico, Centro de Engenharia e Tecnologia Naval e Oceanica

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8335023151

OpenAlex ID: W4407693000

FWCI: 1.446

Cites: 19

Cited by: 2

Related to: 10