Work

Ionizing Radiation-Induced Data Imprinting Effects in SRAM Arrays

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3543233

Authors: Umeshwarnath Surendranathan, Abishek S. Vellankanni, Aleksandar Milenkovic, Ujjawal Guin, Biswajit Ray

Institutions: University of Alabama in Huntsville, Colorado State University, Auburn University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Idaho Operations Office, U.S. Department of Energy

Awards: CNS Core: Small: Ensuring Privacy by Runtime Analog Sanitization of Solid State Storage Devices, G3191048756, Collaborative Research: SaTC: CORE: Small: Exploring Security Risks Arising from SRAM Data Remanence and Evaluating Innovative Sanitization Techniques, CAREER: Leveraging physical properties of modern flash memory chips for resilient, secure, and energy-efficient edge storage systems

OpenAlex ID: W4407693240

FWCI: 1.155

Cites: 22

Cited by: 5

Related to: 10